LOW POWER AND TIMING ERROR MITIGATION CIRCUIT DESIGN BASED ON CLOCK GATING

Parimala Gandhi Ayyavu; Jemima S

Author:

Parimala Gandhi Ayyavu, Jemima S

Published in

Journal of Science Technology and Research

( Volume , Issue )

Page No: 183-201

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Abstract

Timing error is now getting increased attention due to the high rate of error-occurrence on semiconductors. Even slight external disturbance can threaten the timing margin between successive clocks since the latest semiconductor operates with high frequency and small supply voltage. To deal with a timing error, many techniques have been introduced. Nevertheless, existing methods that mitigate a timing error mostly have time-delaying mechanisms and too complex operation, resulting in a timing problem on clock-based systems and hardware overhead. In the proposed work a novel timing-error-tolerant method that can correct a timing error instantly through a simple mechanism is demonstrated. By modifying a clock in a flip-flop, the proposed system can recover a timing error without the loss of time in the clock-based system. Furthermore, in order to reduce power consumption in the stages were operation is not performed clock gating mechanism is used to reduce the unwanted transition. Look-Ahead Clock Gating (LACG) computes the clock enabling signals of each FF one cycle ahead of time, based on the present cycle data of those FFs on which it depends. It has however a big advantage of avoiding the tight timing constraints of earlier methods, by allotting a full clock cycle for the enabling signals to be computed and propagate to their gaters.

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ABSTRACT:

Modern semiconductor circuits frequently encounter timing errors due to high clock frequencies and reduced supply voltages. Even minimal disturbances can threaten timing margins. While various correction techniques exist, most introduce delays and complexity, resulting in hardware overhead and timing problems. In our proposed method, we implement a novel timing-error-tolerant system that instantly corrects errors by modifying the flip-flop clock mechanism. This solution eliminates clock-cycle loss while maintaining system timing. To further reduce power consumption during inactive stages, we incorporate Look-Ahead Clock Gating (LACG), which computes enabling signals one cycle ahead using XOR outputs from flip-flops. LACG avoids tight timing constraints and supports larger, general designs by allotting a full clock cycle for signal propagation. We latch the XOR output using an enhanced AGFF to preserve its validity during the entire positive half-cycle. Due to its simplicity and efficiency, our system achieves instant timing-error recovery with minimal hardware overhead.

INTRODUCTION:

As clock frequencies rise and supply voltages drop, timing errors become increasingly frequent in digital circuits. These errors primarily affect critical paths, especially under variations in CMOS process, voltage, and temperature (PVT) conditions. At 0.4 V, for instance, the slowest logic paths can become 12 times slower than under typical conditions. Additionally, transistor aging effects—particularly negative-bias temperature instability (NBTI)—further aggravate timing errors by increasing path delays. Such challenges demand robust timing-error-tolerant methods for reliable system design. We address these issues by introducing a timing recovery method that modifies flip-flop clocks to correct errors instantly. This method prevents performance loss without disrupting clock-based operations. Additionally, we employ Look-Ahead Clock Gating (LACG) to reduce power consumption, especially in inactive logic stages. LACG generates clock gating signals in advance, avoiding timing bottlenecks and supporting broad-scale circuit designs. These combined strategies enhance timing reliability and power efficiency in advanced semiconductor systems.